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GATE Electronics and Communications (EC) 2015 Shift 1 Solved Paper
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Question : 45
Total: 65
For a silicon diode with long P and N regions, the acceptor and donor impurity concentrations are
1
×
10
17
c
m
3
a
n
d
1
×
10
15
c
m
3
respectively. The lifetimes of electrons in the P-region and holes in the N-region are both 100 μs. The electron and hole diffusion coefficients are
49
c
m
3
and
36
c
m
2
∕
s
respectively. Assume
k
T
q
=
26
m
V
, the intrinsic carrier concentration is
1
×
10
10
c
m
−
3
, and
q
=
1.6
×
10
−
19
C
.
When a forward voltage of 208 mV is applied across the diode, the hole current density (in nA / cm
2
) injected from P region to N region is
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Solution:
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